Threshold scan run: 215 Linearity run number: 4 Number of noise sigma: 4.00 Number of offset sigma: 3.00 Thresh = Noise * 4.00 + (1/(10.5 mV/count)) * [ Offset + Offset RMS * 3.00 ] Chip Thresh Noise Offset Offset RMS Noise fit Offset fit (counts) (counts) (mV) (mV) Chisquare Chisquare ----------------------------------------------------------------------- 0 23 3.12 70.5 14.8 0.83 0.72 1 15 3.03 -23.8 18.4 0.79 1.36 2 24 3.48 63.7 15.6 1.33 0.18 3 28 3.22 111.0 15.0 0.63 1.49 4 23 3.31 53.3 17.2 0.73 0.45 5 23 3.43 49.7 18.4 1.69 1.46 6 23 3.39 53.3 17.9 1.47 1.28 7 16 2.60 20.7 13.7 0.93 0.34 8 15 2.57 5.3 15.5 0.70 0.98 9 8 2.54 -58.2 13.8 1.07 0.66 10 36 0.00 0.0 125.0 1.07 1.07 11 15 2.88 7.3 12.9 1.14 0.71 12 14 2.17 21.5 11.9 1.32 0.84 13 36 0.00 0.0 125.0 1.32 1.32 14 27 4.11 67.0 15.3 1.04 0.67 15 26 4.15 52.8 15.7 0.93 0.44 16 28 4.24 77.0 13.7 1.04 2.32 17 36 0.00 0.0 125.0 1.04 1.04 18 25 4.06 52.9 13.7 0.63 1.07 19 28 4.20 77.1 14.5 0.79 0.52 20 30 4.25 90.4 16.3 1.62 0.83 21 17 2.75 22.0 14.0 1.50 0.50 22 19 2.51 51.0 13.9 1.40 0.27 23 11 2.83 -39.1 15.1 1.00 0.95 24 17 2.84 19.5 13.7 0.80 0.88 25 14 3.04 -19.2 13.9 0.40 0.97 26 22 3.10 49.9 17.9 1.63 0.59 27 21 3.07 56.1 13.9 0.78 0.91