Study of Sensitivity to Multiple Channels Firing at the Same Time
Gain and offset measurements from two sets of runs were compared.
For one set of runs, charge was injected in 16 channels per chip
In the other set of runs, charge was injected one channel at a time.
This measurement has implications for online calibrations since there is
probably not enough time at PEP II to perform the calibrations by firing
one channel at a time.
The plots below show the difference in gain and offset between the two sets of runs.
The measurements were performed with H1-29
before bonding to the silicon.
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